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Ni teststand crack
Ni teststand crack











Scalability to add new functionality and instrumentation as needed.Increased test system flexibility to add new features and adapt to new technologies as they are required.In response to these demands, test managers and engineers are turning to a modular, software-defined test architecture based on industry standards that can provide: Because of these systems’ inflexibility to adapt and add functionality to test newer, more complex products, traditional solutions like rack-and-stack box instruments or proprietary “big iron” automated test equipment (ATE) systems are no longer an efficient way to keep up with today’s demanding markets. To meet the challenges of shorter development cycles, larger product portfolios, decreased budgets, and exponentially more complex products, test engineers are being forced to abandon monolithic, application-specific, and turnkey test systems. Budgets are decreasing while product testing is becoming more expensive.Development cycles are shorter to stay competitive and meet market demand.Product designs are more complex than previous generations.Test engineers are presented with the following realities of today’s product development environment: Although testing remains critical to product quality, the cost of test has not kept up with the lower cost of manufacturing as more complex electronic devices require newer, more advanced instrumentation. As the complexity of devices increases, so does the cost of testing these devices. A big challenge companies face today is the rising cost of test.













Ni teststand crack